Patent · US Expired

Simultaneous processing for error detection and P-parity and Q-parity ECC encoding

US6594796B1 · kind B1 · utility

63Cited by
5References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 30, 2000
Grant dateJul 15, 2003
Priority date
Expiry dateJun 16, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M13/1515
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

Method and system for receiving each data element of an array once and simultaneously forming an EDC error detection term, two ECC P-parity checkbytes and two ECC-Q-parity checkbytes for the array. Each data element is read once from memory and is received by an EDC processor, by an ECC-P processor and by an ECC-Q processor and is processed in parallel and substantially simultaneously by the three processors to form an EDC error detection term and the ECC-P-parity and ECC-Q-parity checkbytes, using shift registers with feed-back and/or weighted summation of selected register contents.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.