Method and apparatus for measuring thermophysical properties
US6595685B2 · kind B2 · utility
8Cited by
9References
2Claims
0Family size
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Key dates
| Filing date | Oct 13, 1999 |
| Grant date | Jul 22, 2003 |
| Priority date | — |
| Expiry date | Oct 13, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method for measuring thermophysical property value of a specimen. The apparatus includes a heating laser and probe laser for measuring at least one characteristic on the surface of the specimen. A detector detects the reflected probe laser beam, and a computer calculates the thermophysical property value of the specimen based on the reflected probe laser beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.