Patent · US Expired

Internal detection of ions in quadrupole ion traps

US6596990B2 · kind B2 · utility

31Cited by

9References

15Claims

0Family size

Assignee

Bruker Daltonik GmbH · DE

Inventors

Arne Kasten · Karlsruhe, DE
Jochen Franzen · Bremen, DE

Key dates

Filing date	Jun 8, 2001
Grant date	Jul 22, 2003
Priority date	—
Expiry date	Dec 26, 2021

Classification

Technology area (CPC H)Electricity
CPC primaryH01J49/025
WIPO fieldElectrical machinery, apparatus, energy
WIPO sectorElectrical engineering

Abstract

The invention relates to methods and devices for the detection of ions in an RF quadrupole ion trap. The invention consists of integrating a detector, such as a secondary-electron multiplier, into the end cap electrode with form and potential fit, thereby avoiding the ion outlet holes in the end caps, which might otherwise lead to field disturbances. Ions that leave the field by mass-selective and mass-sequential ejection using one of the known scan methods are measured when they impact on the end cap electrode. Both positive and negative ions can be measured. In the case of positive ions, it is also possible to measure the ions that impact on the side opposite the detector by means of their secondary electrons.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.