Patent · US Expired

Thin film transistor substrates for liquid crystal displays including thinner passivation layer on storage capacitor electrode than other regions

US6597415B2 · kind B2 · utility

27Cited by
29References
49Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2001
Grant dateJul 22, 2003
Priority date
Expiry dateMar 7, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02F1/1368
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A passivation layer is formed by coating a flowable insulating material on the substrate where a thin film transistor and a storage capacitor electrode, and a pixel electrode is formed on the passivation layer. A portion of the passivation layer is etched using the pixel electrode as a mask to make a groove on the thin film transistor, and then a black matrix is formed by filling an organic black photoresist in the groove. To increase the storage capacitance, a portion of the passivation layer is removed or to form a metal pattern on the storage capacitor electrode. A flowable insulating material is used as a gate insulating layer to planarize the substrate. In the case of the etch stopper type thin film transistor, a photo definable material is used as the etch stopper layer to reduce the parasitic capacitance between the gate electrode and the drain electrode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.