Non-invasive pipe inspection system
US6597997B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 1, 2001 |
| Grant date | Jul 22, 2003 |
| Priority date | — |
| Expiry date | Aug 1, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2675
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed to a system and method for non-invasive pipe inspection. According to one embodiment, the system includes a processor, an analyzer, and a wave launcher. The wave launcher is adapted to transmit an input wideband waveform having a selected input energy into the pipe along a longitudinal axis, and to receive from the pipe a reflected component of the input waveform having a reflected energy. The analyzer is adapted to generate the input waveform, and to receive the reflected component of the input waveform from the wave launcher. The processor is adapted to compare the input waveform with the reflected component of the input waveform to determine characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.