Multi-angle inspection of manufactured products
US6598994B1 · kind B1 · utility
22Cited by
10References
51Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 19, 2000 |
| Grant date | Jul 29, 2003 |
| Priority date | — |
| Expiry date | Jul 19, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S362/80
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An illumination system for inspection of devices is disclosed. The system includes a frame for positioning over an image area. A plurality of light source groups are coupled with the frame and are each configured to produce one or more wavelengths of light. Each light source group is configured to produce a wavelength of light which is not produced by another light source group.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.