Polarization mode dispersion measuring method and polarization mode dispersion measuring system
US6600148B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 23, 2001 |
| Grant date | Jul 29, 2003 |
| Priority date | — |
| Expiry date | Jan 24, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/336
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to the present invention, in a simple structure using a fixed analyzer method, in order to measure a smaller PMD value, a predetermined polarization mode dispersion is applied by a reference object to a linearly polarized beam extracted by a first polarizer from a broad band light emitted from a broad band light source. The polarization plane of the light applied with this predetermined polarization mode dispersion is rotated by a polarization plane rotor, and the spectrum of the linearly polarized beam extracted by a second polarizer from the light emitted from the other end side of the measured object is analyzed, thereby to obtain at least one of a maximum value and a minimum value of the polarization mode dispersion. A value based on a difference between the maximum value and the minimum value of the polarization mode dispersion, or a difference between the maximum value and the predetermined polarization mode dispersion value of the reference object, or a difference between the minimum value and the predetermined polarization mode dispersion value of the reference object, is calculated as a value of the polarization mode dispersion of the measured object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.