Method and apparatus for calibrating DQS qualification in a memory controller
US6600681B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 10, 2002 |
| Grant date | Jul 29, 2003 |
| Priority date | — |
| Expiry date | Jun 10, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/2254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method an apparatus are provided for calibrating a mask signal which is used for masking a data strobe signal that is received from a memory device with read data. According to the method, one or more read operations are performed with the memory device, and the data strobe signal is sampled at a plurality of different time delays relative to a local clock signal to produce a plurality of data strobe sample values. The plurality of data strobe sample values are searched to identify a temporal location within a preamble phase of the data strobe sample values and one of the time delays that corresponds to the temporal location. A delay at which the mask signal is disabled in response to a read operation is then set relative to the local clock signal based on the time delay corresponding to the temporal location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.