Patent · US Expired

Process device diagnostics using process variable sensor signal

US6601005B1 · kind B1 · utility

134Cited by
200References
39Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 25, 1999
Grant dateJul 29, 2003
Priority date
Expiry dateJun 25, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG08C19/02
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

Process device diagnostic is provided for diagnosing the condition of a process by receiving a process variable sensor signal. The process variable sensor senses vibration noise signals carried in a process fluid of the process. The vibration noise signals are generated by the process, such as by operation of process control elements. The diagnostics isolates the process noise signals in the process variable sensor signal and evaluates the isolated signal to diagnoses the process and the process devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.