Patent · US Expired

Test module

US6603327B2 · kind B2 · utility

2Cited by
1References
16Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 8, 2001
Grant dateAug 5, 2003
Priority date
Expiry dateAug 8, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3193
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a test module (1) for comparative testing of an electronic component (2) and a simulation module (3) that simulates the function of the electronic component (2) essentially in the form of a software program. The test module (1) has an input/output interface to an external module (4) interacting with the electronic component (2) to be tested and also to the electronic component (2) and the simulation module (3). Equivalent input interfaces of the electronic component (2) and of the simulation module (3) are connected to one another by the test module (1). In addition, the test module (1) has a comparator (6) for comparing output signals from the electronic component (2) and from the simulation module (3) and has a memory log (7) linked to the comparator (6). The inventive test module (1) permits a rapid comparative test of the functions of the electronic component (2) and of the simulation module (3).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.