Patent · US Expired

Electrostatic chuck and method for forming an electrostatic chuck having porous regions for fluid flow

US6606234B1 · kind B1 · utility

35Cited by
10References
45Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 5, 2000
Grant dateAug 12, 2003
Priority date
Expiry dateApr 14, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/6833
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An electrostatic chuck includes a chuck body having a chucking surface and a back surface, an electrode within the chuck body and at least one conduit for providing fluid communication between the back surface and a chucking surface. The conduit includes a porous region which is integrated with the chuck body. During operation, the temperature of a wafer supported by the electrostatic chuck can be controlled or modified by directing a heat transfer fluid, through the porous region, to the chucking surface. The porous region prevents or minimizes plasma penetration and arcing problems. Also described are methods of fabricating an electrostatic chuck having a porous region.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.