Patent · US Expired

Acceptability testing for capacity planning of data storage system

US6606585B1 · kind B1 · utility

31Cited by
1References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 21, 1999
Grant dateAug 12, 2003
Priority date
Expiry dateAug 21, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3414
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Data storage devices of an enterprise system are tested to determine whether the enterprise system is optimally configured. Each data storage device is tested to determine whether it can satisfy a performance requirement for an assigned group of n workloads. A group of n inequalities are generated, and only up to n of the inequalities may be evaluated to determine whether the device satisfies the performance requirement for the assigned group of workloads. The inequalities are based on a phased, correlated model of I/O activity.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.