Corner simulation methodology
US6606729B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 27, 2001 |
| Grant date | Aug 12, 2003 |
| Priority date | — |
| Expiry date | Sep 27, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/367
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and system for creating a worst case scenario model for a given integrated circuit. The method comprises the steps of sorting skew parameters of each device into groups; and assigning a positive or negative value for each one of the groups to represent the effect of the corresponding skew parameters on the functionality of the integrated circuit. The preferred embodiment of the invention provides some of the benefits of both conventional corner simulation and Monte Carlo simulation. This approach can be implemented with only a few additional simulation iterations, which mitigates the disadvantage of Monte Carlo simulations requiring many simulation iterations. Also, this approach allows a greater degree of flexibility with respect to determining a specific corner file definition, allowing the designer to explore a greater area of model parameter space to insure that the circuit will meet performance requirements over extremes of process technology variation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.