Patent · US Expired

Method of and apparatus for testing a photosensor

US6608293B2 · kind B2 · utility

12Cited by
4References
40Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 18, 2000
Grant dateAug 19, 2003
Priority date
Expiry dateDec 18, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J2001/0481
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention concerns a method and device to carry out the method to provide quality control for a photosensor, especially a photodiode array, whose output signal depends on the intensity of an input signal formed by electromagnetic waves. The photosensor to be tested receives stimulation signals forming the input signals while the stimulation signal intensity of the stimulation signals is varied. The associated output signals of the photosensor to be tested are measured and recorded for evaluation purposes. The photosensor preferably receives at least two independently controllable, superposed individual stimulation signals with individual intensities. The different stimulation signal intensities of the individual stimulation signals are set with the aid of a controller coupled to stimulation signal source, and the output signals of the photosensor are measured and recorded using a measurement data recorder unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.