Method for measuring concentration of trace amount of OH-groups contained in quartz glass
US6608309B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 27, 2001 |
| Grant date | Aug 19, 2003 |
| Priority date | — |
| Expiry date | Apr 27, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N33/386
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for measuring trace quantities of OH groups in quartz glass comprises preparing a set of test pieces comprising a reference test piece from a blank of a quartz glass body whose OH group content is known and a sample test piece from a quartz glass body whose OH group content is to be measured, having two planar planes faced to each other, setting the sample test piece and the reference test piece in an infrared spectrophotometer; successively irradiating perpendicular to one of the two planar planes an incident infrared radiation in a wavelength region of approximately 2500 nm to approximately 2950 nm, while simultaneously detecting the outgoing radiation spectrum from the other plane; obtaining the difference of the outgoing radiation spectrum of each of the test pieces; selecting the absorbance peak assigned to OH groups at a wavelength of 2720 nm to obtain the peak height thereof; and calculating the concentration of OH groups from the peak height in the sample test piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.