Automated sample handling for X-ray crystallography
US6608883B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 10, 2002 |
| Grant date | Aug 19, 2003 |
| Priority date | — |
| Expiry date | May 10, 2022 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography. The method includes activating a robot so that the tool retrieves the crystal holder, receives a sufficient amount of a fluid to maintain the crystal in the crystal holder at a temperature not in excess of about 160 degrees K, transfers the retrieved crystal holder to a positioning device, and mounts the transferred crystal holder on the positioning device, whereby the crystal in the retrieved crystal holder is maintained at a temperature not in excess of about 160 degrees K.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.