Data corruption testing technique for a hierarchical storage system
US6609219B1 · kind B1 · utility
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16References
20Claims
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Key dates
| Filing date | Jan 24, 2000 |
| Grant date | Aug 19, 2003 |
| Priority date | — |
| Expiry date | Jan 24, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/1004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A storage system is described that includes a controller and a disk array. The disk array includes at least a first and a second storage area. The first storage area is associated with a first mean time to failure (MTTF) and the second storage area is associated with a second MTTF. The controller operates to test the first storage area at a first frequency and the second storage area at a second frequency. The first frequency and the second frequency are each based upon the first and second MTTF so as to optimize the overall reliability of the storage system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.