Patent · US Expired

Multiport automatic calibration device for a multiport test system

US6614237B2 · kind B2 · utility

150Cited by
11References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 2001
Grant dateSep 2, 2003
Priority date
Expiry dateSep 18, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R27/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

According to one embodiment of the invention, there is provided an N-port automatic calibration device comprising N-ports, wherein each port is adapted to be coupled to a port of an N-port multiport test set. The N-port automatic calibration device comprises a single-pole, N−1 throw switch having a single-pole coupled to a first port of the automatic calibration device and having each throw of the N−1 throws coupled to a corresponding port of the automatic calibration device. In addition, the N-port automatic calibration device comprises at least one single-pole, double-throw switch, having a single-pole coupled to a second port of the N-ports of the automatic calibration device, having a first throw coupled to a first load impedance, and having a second throw coupled to a throw of the N−1 throws of the single-pole, N−1 throw switch.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.