Patent · US Expired

Wire pattern test system

US6614922B1 · kind B1 · utility

7Cited by
10References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 4, 2000
Grant dateSep 2, 2003
Priority date
Expiry dateJan 4, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/30108
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention includes testing devices and testing systems. This invention also includes machines or electronic apparatus using these aspects of the invention. The present invention also includes methods and processes using these devices and systems. In a preferred embodiment, a testing device and method are described that utilize infrared imaging and computer analysis thereof in detecting and measuring continuity, uniformity, and presence of inhomogeneities of wire heating grids in automotive windshields. The computer is capable of autonomous decision making, and can signal industrial equipment such as robotic actuators to automatically remove faulty windshields from the assembly line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.