Diagnostics in a process control system which uses multi-variable control techniques
US6615090B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 7, 2000 |
| Grant date | Sep 2, 2003 |
| Priority date | — |
| Expiry date | Feb 7, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/027
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A diagnostic tool automatically collects and stores data indicative of a variability parameter, a mode parameter, a status parameter and a limit parameter for a multi-variable function block associated with one or more devices or loops within a process control system, processes the collected data to determine which devices, loops or function blocks have problems that result in reduced performance of the process control system, displays a list of detected problems to an operator and then suggests the use of other, more specific diagnostic tools to further pinpoint or correct the problems. When the diagnostic tool recommends and executes a data intensive application as the further diagnostic tool, it automatically configures a controller of the process control network to collect the data needed for such a tool.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.