Method using statistically analyzed product test data to control component manufacturing process
US6615096B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 31, 2000 |
| Grant date | Sep 2, 2003 |
| Priority date | — |
| Expiry date | Jan 31, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99948
- WIPO fieldIT methods for management
- WIPO sectorElectrical engineering
Abstract
A method and system for providing a manufacturing information system is disclosed. The system comprises a means for receiving and storing in a data warehouse component identifiers for identifying component manufacturing parameters for a quantity of components. The system further includes product identifiers for identifying manufactured products. The system further comprises a relational means for relating the component identifiers with the product identifiers for the products in which the components are included. The system further comprises a means for receiving a sub-set of the product identifiers, wherein the sub-set of product identifiers is for identifying a sub-set of the products which have a variation in performance. The system further comprises an analytical tool for correlating at least one of the component identifiers with the received sub-set of product identifiers, thereby identifying the component manufacturing parameter identified by the at least one component identifier as a possible cause of the variation in performance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.