Patent · US Expired

Procedure and device for specific particle manipulation and deposition

US6616987B1 · kind B1 · utility

11Cited by
14References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 2000
Grant dateSep 9, 2003
Priority date
Expiry dateSep 29, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32366
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A process for manipulating particles distributed substantially non-uniformly in a plasma of a carrier or reaction gas, wherein Coulomb interaction between the particles is so low that the particles substantially do not form a plasmacrystalline state, and the particles are exposed in a location-selective manner to external adjustment forces and/or the plasma conditions are subjected to a location-selective change to apply at least a portion of the particles onto a substrate surface mask-free and/or subject it to a location-selective plasma treatment in the carrier or reaction gas.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.