Contactor of the device for testing semiconductor device
US6617843B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 6, 2001 |
| Grant date | Sep 9, 2003 |
| Priority date | — |
| Expiry date | Sep 6, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2863
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention discloses a contactor of the device for testing a semiconductor device comprising a fixed block receiving a test tray having a plurality of a semiconductor device, a base plate having a cylinder on one side of the base plate and installed in one side of the fixed block, a push plate moving forward and backward by the cylinder and installed between the base plate and the fixed block, a plurality of an air nozzle to be contacted to the test tray by a forward and backward movement of the push plate having the cylinder, and installed in the push plate and protruded to the test tray, and a providing means of blending air to guide and provide the blending air for the air nozzle.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.