Method and circuit configuration for monitoring machine parameters
US6618637B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 20, 2000 |
| Grant date | Sep 9, 2003 |
| Priority date | — |
| Expiry date | Oct 20, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B19/408
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A circuit configuration for monitoring machine parameters of a numerical controller for a machine tool where the circuit configuration includes a first processor calculating a first checksum and a third checksum, a first memory assigned to the first processor and has a bidirectional connection with the first processor, wherein the first memory stores machine parameters, a second processor calculating a second checksum and a fourth checksum, a second memory that has a bidirectional connection with the first processor and the second processor and a comparator connected to the first and second memories and the first and second processors, the comparator comparing the first and third checksums with one another and the second and fourth checksums with one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.