Method and apparatus for measurement alignment
US6618674B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2001 |
| Grant date | Sep 9, 2003 |
| Priority date | — |
| Expiry date | Sep 7, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V1/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for aligning measurements of a hostile environment includes synchronizing at least two clocks, wherein at least a first clock is in the hostile environment, measuring characteristics of the hostile environment, aligning time domain curves of the collected measurements, correlating the curves using one or more events recorded by each clock, and correcting the curves by adding one or more time offsets. The offsets may be added to a found resent event or at other locations on the time domain curve. A second clock may be located outside the hostile environment or within a same or similar hostile environment. The collecting the measurements may be taken by a first measurement tool in a first device near the first clock and in at least a second device coupled to a second clock.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.