Patent · US Expired

Non-invasive testing of smart cards

US6618685B1 · kind B1 · utility

3Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 17, 2000
Grant dateSep 9, 2003
Priority date
Expiry dateFeb 24, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31905
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A system and method is provided for non-invasive testing of smart cards. In a preferred embodiment, a host computer is connected to a controller, which is then connected, through a switch, to at least one computing device and at least one testing device. The testing device further includes a card terminal and a probe. Each probe includes a motor that is coupled to a cylindrical tube. The motor-tube configuration is used to actuate a card detect sensor in the card terminal. In response to a command provided by the host computer, the controller initiates a particular test. In one test, for example, the motor-tube configuration is used to simulate repeated insertions and removals of smart cards.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.