X-ray inspection by coherent-scattering from variably disposed scatterers identified as suspect objects
US6621888B2 · kind B2 · utility
89Cited by
16References
27Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 8, 2002 |
| Grant date | Sep 16, 2003 |
| Priority date | — |
| Expiry date | Jul 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/222
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and method for inspecting an enclosure with penetrating radiation. Radiation side-scattered from an object within the enclosure is detected, allowing the object to be located. If the object is deemed suspect, a volume element of the suspect object is further irradiated with penetrating radiation, and radiation coherently-scattered by the volume element is detected. The energy spectrum and angular distribution of the coherently-scattered radiation are used to characterize the volume element of the suspect object.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.