Methods and systems for fault location
US6622285B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 2, 2000 |
| Grant date | Sep 16, 2003 |
| Priority date | — |
| Expiry date | Apr 17, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/079
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for fault location are described. In one described embodiment, an “in circuit” solution is provided for locating faults along a passive transmission line. Once a fault occurs, various hardware gathers information that is necessary to determine which of a number of different replaceable components has failed. This enables the subsystem to properly respond to the fault condition and thereby eliminate any guessing that could potentially lead to loss of data availability. In the particular described embodiment, signals are driven and received through a selected input/output (I/O) pad. Logic circuitry is provided and launches a wave onto the passive transmission line. Immediately following the launching of the wave, the I/O pad is monitored and can sense the reflections from the wave that has just been launched. By analyzing the reflections, and more specifically the time that it takes for the reflection to be sensed, a determination is made as to the fault location. Once the fault location (or distance thereto) is ascertained, a determination can be made as to which component has failed. At this point, an intelligent decision can be made as to which comp…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.