Method and apparatus for determining a magnetic field
US6625554B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 22, 2001 |
| Grant date | Sep 23, 2003 |
| Priority date | — |
| Expiry date | Nov 30, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/315
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention provides a magnetic field measuring method and system for determining the magnetic field of an integrated circuit (IC) inside the IC package, including the pre-packaged IC. In one embodiment, induced voltages due only to the magnetic field are determined at measurement heights on the order of the line spacings in an integrated circuit. A magnetic probe is used; the probe has a loop of wire parallel to the current, for measuring the induced voltage of the horizontal component of the magnetic field. The induced voltage due to the electric field is removed by using a calculation including the difference of two measurements. The magnetic field distribution for the integrated circuit may be determined by using the above procedure on a grid like pattern above the IC.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.