Mixed signal device under test board interface
US6625557B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 10, 1998 |
| Grant date | Sep 23, 2003 |
| Priority date | — |
| Expiry date | Jul 10, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3167
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A mixed signal integrated circuit testing system includes a system controller connected to a test head for controlling the testing operations of the mixed signal integrated circuit testing system. The test head is adapted to support a wide combination of both the analog and digital circuit testing modules. A DUT board, typically configured for a specific IC or family of ICs, is used to connect the circuit testing modules to the IC. The DUT board is connected to a DUT board interface that includes an analog DUT board interface adapter and a digital DUT board interface adapter. The digital DUT board interface adapter is connected directly to the digital circuit testing modules. The analog DUT board interface adapter is connected to a system configuration module that provides analog loading and conditioning circuitry as well as other circuitry that can be customized for testing specific ICs.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.