Method of testing serial interface
US6625560B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 13, 2001 |
| Grant date | Sep 23, 2003 |
| Priority date | — |
| Expiry date | Nov 12, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing a circuit having an interface which includes data and clock information where phase jitter is introduced into the clock that produces the clock information. The clock is cycled by increasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift advance in the clock. The clock is also cycled by decreasing the period of the clock for a predetermined number of clock cycles so as to introduce an increasing phase shift delay in the clock. The circuit under test is caused to sample the data using a clock derived from the clock information. The sampled data is then compared with reference data to determine the error rate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.