Wireless test fixture for printed circuit board test systems
US6628130B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 18, 2001 |
| Grant date | Sep 30, 2003 |
| Priority date | — |
| Expiry date | Aug 18, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A wireless test fixture is disclosed for connecting printed circuit boards or other electrical interconnect devices having electronic components to a test system. Rigid support beams and insulating spacers are used to reduce the structural loads on the electrical interconnect plane and to minimize probe mounting plate deflections in the wireless test fixture. The test system electrical interface is via a series of floating transfer pins. The floating transfer pins provide electrical signal paths between test system interface probes and the electrical interconnect plane that interfaces with double-end sockets coupled to a probe for making electrical contact with the DUT. One or more fixed double-ended sockets and spring probes are used to make electrical contact with the DUT.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.