Patent · US Expired

Method for detecting chaotic structures in a given medium

US6628806B1 · kind B1 · utility

2Cited by
7References
5Claims
0Family size

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Key dates

Filing dateJul 17, 2000
Grant dateSep 30, 2003
Priority date
Expiry dateJul 17, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01V1/28
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method of detecting chaotic structures in a given medium.It is of the type consisting in:calculating the components of the light intensity gradient vector E at every point of a window F, centered on a point of a block representative of the medium, and it is characterized in that it furthermore consists in summing elementary matrices M for all the points of the window F, diagonalizing said sum matrix A so as to determine its eigenvalues &lgr;1, &lgr;2, &lgr;3, quantifying, at the center of the window, the minimum of the said eigenvalues &lgr;1, &lgr;2, &lgr;3, and with the constraint UT×D=1, eliminating the contribution of the largest eigenvalue, defining a multidirectional error by integrating it in the plane defined by the eigenvectors corresponding to the remaining eigenvalues, assigning the multidirectional error to the image point on which the window F is centered, and calculating the multidirectional errors assigned to all the image points of the image block.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.