Patent · US Expired

Measurement test instrument and associated voltage management system for accessory device

US6629048B1 · kind B1 · utility

13Cited by
25References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 20, 2000
Grant dateSep 30, 2003
Priority date
Expiry dateSep 22, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/067
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement test instrument voltage management system for an accessory device has a accessory device interface that provides a voltage to a memory device in the accessory device. A sensing circuit receives a sensing signal from the accessory device when it is connected to the interface. The sensing circuit generates an interrupt signal that is coupled to a controller. The controller initiates the generation of a clock signal that is coupled to the accessory device through the interface to retrieve accessory device data stored in the device memory. The controller determines if the connected accessory device is a valid device capable of being supported by the measurement test instrument. The controller generates an enable signal for a valid and supported device that is coupled to a voltage switching circuit. The voltage switching circuit generates at least a first output voltage that is coupled to the accessory device via the interface to provide power to the accessory device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.