Patent · US Expired

Temperature measurement and temperature controlled switching using change in helical sense

US6630997B2 · kind B2 · utility

3Cited by
5References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 26, 2001
Grant dateOct 7, 2003
Priority date—
Expiry dateJun 16, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01K11/165
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Helical arrays comprising structurally different chiral non-racemic molecules or molecular entities that control the helical sense of the helical array provide a method for temperature measurement with a unique characteristic in that the temperature dependent chiral biases of the competing structurally different chiral non-racemic entities control the helical sense population since these biases differ in their temperature dependence. By varying the composition of the chiral non-racemic entities, the temperature at which the helical sense population is equal and how the helical sense population varies as a function of temperature can be controlled.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.