Device and procedure for the quality control of in particular finished surfaces
US6631000B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 19, 2000 |
| Grant date | Oct 7, 2003 |
| Priority date | — |
| Expiry date | Mar 24, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/57
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a device and a procedure for the quality control of in particular finished surfaces wherein the device comprises at least one illuminating means having at least one light source, its light directed at a predetermined angle to the measurement surface. A plurality of at least three measuring means is provided, whereby each of said measuring means is directed at a different predetermined angle to the measurement surface and receives a portion of the light reflected from said measurement surface. Each measuring means comprises at least one photosensor which emits an electrical measurement signal which is characteristic of the light received by said measuring means. A control and evaluation means having at least one processor means and one memory means controls the measurement sequence, evaluates the measurement results and derives therefrom a parameter which characterizes the surface. An output means serves for the outputting of parameters or measurement results.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.