Device and method for determining frequency and amplitude of an oscillating structure, especially for measuring acceleration or rotational rates
US6631641B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 5, 2001 |
| Grant date | Oct 14, 2003 |
| Priority date | — |
| Expiry date | Aug 3, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P15/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for determining the frequency and/or the amplitude of a vibrating structure includes a vibrating element (2) and a pair of position sensors (10, 11) for the determination of the deflection of the vibrating element (2). The position sensors (10, 11) are arranged such that their measurements during a half-wave of vibration exceed and/or are less than one another. A comparator compares the measurements of the two position sensors (10, 11) to determine a threshold value Us for the half-wave of the vibration at which their measurements are equal. A device is used for determining the duration during which the measurement of one of the two position sensors (10, 11) exceeds or is less than the threshold value Us. The position sensors (10, 11) can be capacitors whose electrodes are arranged in a step-like manner. The determination of the amplitude of the vibration is, carried out independent of a potential parallel shift of the movable element (2), such that there is no distortion of the measurement result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.