Method and apparatus for calibrating an imaging system
US6632020B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 12, 2001 |
| Grant date | Oct 14, 2003 |
| Priority date | — |
| Expiry date | Oct 12, 2021 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/4035
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for calibration of an imaging system includes providing a calibration phantom system including a first phantom element material block having a first surface at a first height, wherein the first phantom element material block at least partially includes a first material having a first attenuation coefficient. Providing a calibration phantom system also includes providing a second phantom element material block having a second surface at a second height different than the first height, the second phantom element material block at least partially including a second material having a second attenuation coefficient different than the first attenuation coefficient, wherein the first phantom element material block and said second phantom element material block are co-positioned on a detector. The method also includes imaging the calibration phantom system to obtain phantom images, processing the phantom images, and extracting a plurality of calibration values from the processed phantom images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.