Patent · US Expired

Method and device for optoelectronic distance measurement

US6633367B2 · kind B2 · utility

48Cited by
3References
29Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 23, 2001
Grant dateOct 14, 2003
Priority date
Expiry dateJan 23, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01S17/36
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention is directed to a method for optoelectronic distance measurement and a measurement device based on this method, in which two light emitters, particularly laser emitters and two photodiode receivers are used for calibration. Part of the modulated output of the main emitter reaches the measurement object and then arrives at the main photoreceiver in the form of scattered light and another part of the output of the main emitter travels directly to a reference photoreceiver, while a part of the modulated output of the reference light emitter is guided directly to the main photoreceiver and another part is guided directly to the reference photoreceiver. According to the invention, the light intensities of the main emitter and the reference emitter are simultaneously modulated with different modulation frequencies (f1, f2), and a signal mixture is formed in the main receiver as well as in the reference receiver, which signal mixture contains a signal with the intensity modulation frequency (f1) of the main emitter and a signal with the intensity modulation frequency (f2) of the reference emitter. The phases of the two signals of the signal mixture are measured simultaneously…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.