Patent · US Expired

Method for integrally detecting leaks in test pieces with relatively thin walls

US6634215B1 · kind B1 · utility

2Cited by

3References

5Claims

0Family size

Assignee

INFICON AG · LI

Inventors

Markus Nothhelfer · Kerpen, DE
Rudi Widt · Recklinghausen, DE

Key dates

Filing date	Apr 9, 2001
Grant date	Oct 21, 2003
Priority date	—
Expiry date	Apr 9, 2021

Classification

Technology area (CPC G)Physics
CPC primaryG01M3/227
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method for the integral leak detection on test samples with relatively thin walls, in which the test sample (1) comprising the test gas is tested for leaks in a test chamber; in order to test whether or not test samples are properly filled with test gas, it is proposed that for checking the test gas concentration in the test samples (1), the test gas concentration in at least one of the test samples (1) is measured thereby that its wall (2) is provided with a leak (4), and that with this test sample (1) a leak detection process is carried out.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.