Systems, methods and computer program products for constructing sampling plans for items that are manufactured
US6636818B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 15, 1999 |
| Grant date | Oct 21, 2003 |
| Priority date | — |
| Expiry date | Sep 15, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A desired Acceptable Quality Limit (AQL), a desired Key Defect Rate (KDR), a desired power of a sampling plan for items that are manufactured and a desired false alarm rate for the sampling plan are input into a computer. The computer calculates a required sample size to provide the desired AQL, the desired KDR, the desired power of the sampling plan for the items that are manufactured and the desired false alarm rate for the sampling plan. Thus, each of the individual parameters may be independently specified based on the items that are manufactured, desired AQLs, KDRs, power and false alarm rates. Reliance on ANSI/ASQ Z1.9 tables which might best fit a user's desired parameters can be reduced and preferably eliminated. In addition to calculating the required sample size, a decision rule critical value also may be calculated based upon the required sample size to provide the desired AQL, the desired KDR, the desired power and the desired false alarm rate for the sampling plan. Following the calculations, a relationship between sample size, acceptable number of defective items and false alarm rate automatically may be graphically displayed based upon the desired AQL, the desired KD…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.