Patent · US Expired

Method for improving the performance of micromachined devices

US6636819B1 · kind B1 · utility

6Cited by
41References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 5, 2000
Grant dateOct 21, 2003
Priority date
Expiry dateNov 27, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/56
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for improving the performance of a micromachined device, preferably an angular rate microsensor, is provided. The method includes collecting data on rate bias over a selected operating phase demodulation angles for at least one tine of a microsensor and determining optimum settings for phase demodulation angles at which the rate bias hysteresis over temperature is at a minimum by applying dynamic programming.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.