Apparatus and method for measuring a contoured surface
US6637123B2 · kind B2 · utility
2Cited by
24References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2001 |
| Grant date | Oct 28, 2003 |
| Priority date | — |
| Expiry date | Oct 23, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A contact gauge for measuring a contoured surface on work piece is presented having a matching contoured profile and multiple sensors inserted in a gauge body. The gauge body uses bores filled with spherical balls. At least one ball from each bore contacts the contoured surface, which causes displacement of the ball. The displacement is transferred to and recorded by the sensor. The layout of the gauge permits multiple sensors to be mounted in a compact gauge housing and the gauge housing, in turn, may connected to a robotic arm for rapid and repeated use as an automated measurement apparatus for a component assembly line.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.