Technique for imaging electrical contacts
US6639661B2 · kind B2 · utility
0Cited by
7References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 8, 2001 |
| Grant date | Oct 28, 2003 |
| Priority date | — |
| Expiry date | Jan 27, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/68
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A congruence between the element that provides an electrical conductive path in a component of micron dimensions and an imaging of that element provides a basis for predicting the effectiveness and the consistency in the functioning of the element in an actual operating environment. The element is formed first into a sandwich whereby the operating end is deformed against a light transparent surface. By directing a beam of light into the end of that light transparent surface, the asperity of the operating end produces a light scattering effect that is imaged by microscopic optics that is located facing the operating end.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.