Device and method for forming a computed X-ray tomogram with scatter correction

US6639964B2 · kind B2 · utility

Assignee

• KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

• Stefan Schneider · Aachen, DE
• Josef Lauter · Geilenkirchen, DE
• Herfried Karl Wieczorek · Aachen, DE
• Olaf Such · Aachen, DE

Key dates

• Filing date: Sep 26, 2001
• Grant date: Oct 28, 2003
• Expiry date: Feb 28, 2022

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B6/4291
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

The invention relates to a method for scatter correction while forming a computed X-ray tomogram. The distribution of the scattered radiation is determined by detector cells (7′) which, because of the measuring method carried out, are shielded from direct irradiation in a two-dimensional, multi-cell detector field (3). This distribution is used to perform a scatter correction in the neighboring, directly irradiated detector cells (7). Furthermore, scatter correction can be performed by computer simulation of the scatter processes. To this end, use is preferably made of a Monte Carlo method and the effect of the geometry and the material composition of the measuring arrangement, of the patient size, of the irradiated tissue and the like, is taken into account.