Differential scanning calorimeter
US6641300B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 29, 2002 |
| Grant date | Nov 4, 2003 |
| Priority date | — |
| Expiry date | Apr 8, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/4833
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for calibrating thermal resistance and thermal capacitance parameters characterizing a DSC cell, and then calculating the heat flow to the sample based upon the results of the calibration. The method is applied in a conventional heat flux calorimeter, to obtain thermal analysis data having improved baseline and resolution. A first embodiment is based upon a model of a calorimeter in which there is no cross-talk between the sample and reference sides of a DSC cell. The thermal resistance and thermal capacitance parameters are calculated by carrying out a sequential series of calibration measurements with an empty DSC cell, materials on the reference side and materials on both the sample and reference sides. Another embodiment takes the existence of cross-talk between the sample and reference sides of the calorimeter into account.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.