Patent · US Expired

Low loss dielectric materials for microwave applications

US6641940B1 · kind B1 · utility

15Cited by
3References
4Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 9, 2001
Grant dateNov 4, 2003
Priority date
Expiry dateOct 9, 2021

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC04B2235/761
  • WIPO fieldMaterials, metallurgy
  • WIPO sectorChemistry

Abstract

Composition for a solid state material, in bulk and in thin film form, that provides relatively high dielectric permittivity that is tunable with variable electrical field bias, relatively low loss tangent and low leakage current for microwave applications. In a first embodiment, the material is BaySr1−yTi1−xMxO3, where M is a substance or mixture including one or more elements drawn from a group consisting of Ta, Zr, Hf, V, Nb, Al, Ga, Cr, Mo, W, Mn, Sc and Re, and the indices x and y satisfy 0≦x≦1 and 0≦y≦1. A preferred choice is M=Ta, V, W, Mo and/or Nb. In a second embodiment, the material is BaySr1−yTi1−x−zTaxMzO3, where M is a substance or mixture including one or more trivalent elements drawn from a group consisting of Al, Ga and Cr and the indices x, y and z satisfy 0≦x+z≦1 and 0≦y≦1.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.