Patent · US Expired

Electrophotosensitive material, production method of the same and method for inspecting an intermediary of the same

US6641968B2 · kind B2 · utility

0Cited by
3References
3Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 22, 2002
Grant dateNov 4, 2003
Priority date
Expiry dateMar 22, 2022

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03G5/142
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The invention relates to an electrophotosensitive material comprising an intermediate layer formed between a conductive substrate and a photosensitive layer, and featuring heat treatment conditions for forming the intermediate layer defined such that a ratio A2/A1 between absorbances at two measurement wavelengths determined from a visible absorption spectrum of the intermediate layer is not more than a value of an intersection of a first approximation line and a second approximation line given by a correlation distribution between the absorbance ratio and the residual potential of the photosensitive material, the first approximation line representing little change of the residual potential despite the increase of the ratio A2/A1, the second approximation line representing a proportional increase of the residual potential with increase of the ratio A2/A1. The invention provides the electrophotosensitive material free from the variations of residual potential.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.