Method and device for integrated testing for an analog-to-digital converter
US6642870B1 · kind B1 · utility
5Cited by
2References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 20, 2002 |
| Grant date | Nov 4, 2003 |
| Priority date | — |
| Expiry date | Jun 20, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
A device for self-testing of an analog-to-digital converter includes elements for applying to the converter test signals and analyzing elements. The analyzing elements include common resources (10,36) integrated in the circuit bearing the converter and capable of being configured to determine successively shift, gain and non-linearities of the converter and elements for configuring and controlling the common resources (10,36) so as to adapt them to the characteristics to be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.