Performance measurement for embedded systems
US6643609B2 · kind B2 · utility
6Cited by
6References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 15, 2002 |
| Grant date | Nov 4, 2003 |
| Priority date | — |
| Expiry date | May 15, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2201/885
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An embedded system includes a microprocessor and performance measuring logic coupled to the microprocessor and configured to record selected performance metrics. In the given routine. In general, a counter is configured to record statistics for each of the performance metrics, and the counters may be controlled using a programmable mask, which is included in a memory coupled to the microprocessor. Based on these metrics, designers may fine-tune software for the embedded system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.